Stram with self-reference read scheme

Static information storage and retrieval – Systems using particular element – Magnetoresistive

Reexamination Certificate

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C365S189150, C365S209000

Reexamination Certificate

active

07876604

ABSTRACT:
Self-reference reading a magnetic tunnel junction data cell methods are disclosed. An illustrative method includes applying a read voltage across a magnetic tunnel junction data cell and forming a read current. The magnetic tunnel junction data cell has a first resistance state. The read voltage is sufficient to switch the magnetic tunnel junction data cell resistance. The method includes detecting the read current and determining if the read current remains constant during the applying step. If the read current remains constant during the applying step, then the first resistance state of the magnetic tunnel junction data cell is the resistance state that the read voltage was sufficient to switch the magnetic tunnel junction data cell to.

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PCT International Search Report and Written Opinion dated Jun. 8, 2010.
Hosomi et al., A Novel nonvolatile Memory with Spin Torque Transfer Magnetization Switching; Spin-RAM, 2005 IEEE.
U.S. Appl. No. 12/147,723, Li.

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