Storage data unit using hot carrier stressing

Details Storage data unit using hot carrier stressing Storage data unit using hot carrier stressing

2008-12-10

2010-11-16

Nguyen, Tan T. (Department: 2827)

Static information storage and retrieval

Read/write circuit

C365S184000

Reexamination Certificate

active

07835195

ABSTRACT:
The memory comprises at least two data storage units using hot carrier stressing damage to store data. Each data storage unit comprises the first terminal, the second terminal and a third terminal. When the first cross voltage between the second and third terminals is higher than the first threshold voltage and the second cross voltage between the first and third terminals is higher than the second threshold voltage, the data storage unit is in the first writing operation.

REFERENCES:
patent: 4843442 (1989-06-01), Boudou et al.
patent: 6018475 (2000-01-01), Papadas et al.
patent: 6859390 (2005-02-01), Pashmakov
patent: 7764541 (2010-07-01), Kohler et al.
patent: 09223750 (1997-08-01), None
patent: 2005081258 (2005-09-01), None
Extended EP Search Report issued Feb. 10, 2009.
English Abstract of JP09223750.

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