Storage cell having buffer circuit for driving the bitline

Static information storage and retrieval – Systems using particular element – Flip-flop

Reexamination Certificate

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Details

C365S156000, C365S189040, C365S230050

Reexamination Certificate

active

07957178

ABSTRACT:
An integrated circuit includes a memory array including a plurality of memory cells, the memory cells include a core storage element having at least a first storage node (S) and a complementary second storage node (S-bar), and a first pass gate coupled to the first storage node (S). A single bitline (BL) is coupled to a node in a source drain path of the first pass gate. The BL is for Reading data from and Writing data to the first storage node (S). A buffer circuit includes a second pass gate and a driver transistor, wherein the second pass gate is coupled between the driver transistor and the source drain path of the first pass gate. A gate of the driver transistor is coupled to the second storage node (S-bar). At least one wordline (WL) is coupled to the first pass gate and the second pass gate.

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