Optics: measuring and testing – By particle light scattering – With photocell detection
Patent
1984-08-16
1986-08-26
McGraw, Vincent P.
Optics: measuring and testing
By particle light scattering
With photocell detection
162 49, 162263, 250564, 356446, G01N 2153
Patent
active
046079556
ABSTRACT:
An electro-optical meter for indicating consistency of a liquid slurry, employs a light source and a detector of backscattered radiation. The light is caused to scan the slurry while holding the light intensity and the peak-to-peak value of the detected signal constant. The distribution of backscattered light is measured and the minimum to maximum intensity of backscattered light is controlled.
REFERENCES:
patent: 3661462 (1972-05-01), Natens
patent: 3962581 (1976-06-01), Zimmerman
patent: 4318180 (1982-03-01), Lundqvist et al.
Kemon Solon B.
McGraw Vincent P.
The Electron Machine Corporation
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