Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2006-09-26
2006-09-26
Prenty, Mark V. (Department: 2822)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S900000, C438S303000
Reexamination Certificate
active
07112859
ABSTRACT:
Embodiments of the invention provides a stepped tip junction region between a source/drain region of a transistor and a gate. In some embodiments, a spacer of the transistor includes a tip junction spacer layer and a source/drain spacer layer.
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Ban Ibrahim
Bohr Mark
Natarajan Sanjay
Sell Bernhard
Intel Corporation
Plimier Michael D.
Prenty Mark V.
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