Statistical analysis of sampled profile data in the...

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability

Reexamination Certificate

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C714S033000, C702S057000, C717S120000, C717S124000

Reexamination Certificate

active

07577875

ABSTRACT:
Sampled profile data provides information about processor activity during a test. Processor activity can be analyzed to determine an amount of processor resources used to execute the various functions, modules, and processes associated with a tested software activity. Statistical methods can be applied to the resource data from multiple test runs to determine whether a significant regression has occurred between a baseline test pass and a daily test pass. By collecting data at the function, module and process levels, significant regressions may be uncovered at any of the levels. Regressions may also be ranked according to their importance, which allows for identification and notification of development teams responsible for significant regressions.

REFERENCES:
patent: 5325525 (1994-06-01), Shan et al.
patent: 5694540 (1997-12-01), Humelsine et al.
patent: 5784554 (1998-07-01), Hsiung
patent: 5798950 (1998-08-01), Fitzgerald
patent: 6047389 (2000-04-01), Thai
patent: 6049798 (2000-04-01), Bishop et al.
patent: 6347366 (2002-02-01), Cousins
patent: 6434714 (2002-08-01), Lewis et al.
patent: 6519766 (2003-02-01), Barritz et al.
patent: 6604210 (2003-08-01), Alexander et al.
patent: 6807522 (2004-10-01), Orfali
patent: 6810495 (2004-10-01), Castelli et al.
patent: 6966013 (2005-11-01), Blum et al.
patent: 7243145 (2007-07-01), Poortman
patent: 7490325 (2009-02-01), Jackson
patent: 7496900 (2009-02-01), Dimpsey et al.
patent: 2001/0020284 (2001-09-01), Tsuda et al.
patent: 2002/0120797 (2002-08-01), Fabre
patent: 2003/0085888 (2003-05-01), Lafruit
patent: 2003/0112758 (2003-06-01), Pang et al.
patent: 2003/0204759 (2003-10-01), Singh
patent: 2004/0073475 (2004-04-01), Tupper
patent: 2004/0154001 (2004-08-01), Haghighat et al.
patent: 2004/0254765 (2004-12-01), Lee et al.
patent: 2005/0065746 (2005-03-01), Dohle et al.
patent: 2005/0102114 (2005-05-01), Yasala
patent: 2005/0120111 (2005-06-01), Bailey et al.
patent: 2005/0267702 (2005-12-01), Shah et al.
patent: 2005/0283664 (2005-12-01), Coulter et al.
patent: 2006/0005082 (2006-01-01), Fossum et al.
patent: 2006/0129892 (2006-06-01), Diaconu et al.
patent: 2006/0150190 (2006-07-01), Gusler et al.
patent: 2006/0200546 (2006-09-01), Bailey et al.
patent: 2007/0028010 (2007-02-01), Krasnansky
patent: 2007/0050677 (2007-03-01), Klamik

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