Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2005-02-01
2005-02-01
Siek, Vuthe (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000
Reexamination Certificate
active
06851098
ABSTRACT:
Static timing analysis results from multiple corner cases are combined to create a differential results table that may be used to identify components that are a high risk for failure. These results may be combined with a schematic analysis tool that finds overlapping logic cones for specific nodes of a circuit such as a failing output pin. These tools are specifically adapted to assist an engineer in the design and debugging of complex circuits, such as integrated circuits.
REFERENCES:
patent: 5095454 (1992-03-01), Huang
patent: 6195788 (2001-02-01), Leaver et al.
patent: 6427226 (2002-07-01), Mallick et al.
patent: 6658635 (2003-12-01), Tanimoto
Cochran Freund & Young
Lin Sun James
LSI Logic Corporation
Siek Vuthe
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