Static semiconductor memory with readout inhibit means

Static information storage and retrieval – Read/write circuit – Signals

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36518905, 3652335, 36518907, G11C 11413

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active

049823663

ABSTRACT:
A static semiconductor memory device includes a memory cell array including a large number of static memory cells arranged in a matrix fashion, a word decoder, a column decoder, and a data buffer. An address delay buffer is provided for delaying an input address signal by a predetermined delay time and a comparator circuit is provided for comparing the input address signal with the delayed address signal from the address delay buffer, so that even if the input address signal is disturbed by noise, the erroneous data corresponding to the disturbed address signal is not read into the data buffer by means of the output signal of the comparator circuit and is not output from the memory device.

REFERENCES:
patent: 4272832 (1981-06-01), Ito
patent: 4480321 (1984-10-01), Aoyama
patent: 4486883 (1984-12-01), Kanai et al.
patent: 4573147 (1986-02-01), Aoyama et al.
Mackie et al., "Echo Check Circuit", IBM Technical Disclosure Bulletin, vol. 11, No. 2, July, 1968, pp. 197-198.
Burke, "Diagnostic Mode", IBM Technical Disclosure Bulletin, vol. 13, No. 3, Aug., 1970, pp. 655-656.

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