Computer-aided design and analysis of circuits and semiconductor – Integrated circuit design processing – Testing or evaluating
Reexamination Certificate
2011-05-17
2011-05-17
Whitmore, Stacy A (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Integrated circuit design processing
Testing or evaluating
Reexamination Certificate
active
07945886
ABSTRACT:
The present invention provides a method a system for facilitating enhanced processing of state diagrams in a state diagram environment. The method may include top-down processing a current state in a state diagram environment; determining whether processing of the current state results in an exception event; and passing the exception event to a superstate that includes the current state when it is determined that the current state results in an exception event. The superstate may be made the current state and it may be determined whether the current state can handle the exception event. When it is determined that the current state cannot handle the exception event, it may be determined whether the current state has a second superstate that includes the current state. An error event may be output from the state diagram environment when it is determined that the current state does not have a second superstate.
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Mestchian Ebrahim Mehran
Raghavan Vijay
Canning Kevin J.
Nelson Mullins Riley & Scarborough LLP
The MathWorks, Inc.
Whitmore Stacy A
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