Semiconductor device manufacturing: process – Bonding of plural semiconductor substrates – Warping of semiconductor substrate
Reexamination Certificate
2006-04-14
2009-08-18
Coleman, W. David (Department: 2813)
Semiconductor device manufacturing: process
Bonding of plural semiconductor substrates
Warping of semiconductor substrate
C438S458000, C257SE21121
Reexamination Certificate
active
07575982
ABSTRACT:
Methods are provided of fabricating compound nitride semiconductor structures. A group-III precursor and a nitrogen precursor are flowed into a processing chamber to deposit a first layer over a surface of a first substrate with a thermal chemical-vapor-deposition process. A second layer is deposited over a surface of a second substrate with the thermal chemical-vapor-deposition process using the first group-III precursor and the first nitrogen precursor. The first and second substrates are different outer substrates of a plurality of stacked substrates disposed within the processing chamber as a stack so that the first and second layers are deposited on opposite sides of the stack. Deposition of the first layer and deposition of the second layer are performed simultaneously.
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Bour David
Eaglesham David
Nijhawan Sandeep
Smith Jacob
Washington Lori
Applied Materials Inc.
Coleman W. David
Crawford Latanya
Townsend and Townsend / and Crew LLP
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