Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Patent
1994-01-27
1999-09-14
Arroyo, Teresa M.
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
257306, 257308, 257309, H01L 27108
Patent
active
059526882
ABSTRACT:
A method of forming a microelectronic device is described comprising the steps of providing a substrate, forming a conductive region on the substrate, and forming an insulating layer on said conductive region and said substrate. The method further comprises the steps of forming a spacer layer on said insulating layer, removing selective portions of said spacer layer and said insulating layer to expose a selective area of said conductive region thereby forming a storage node contact window, and forming a first conductive layer on said spacer layer and within said storage node contact window wherein said first conductive layer is in electrical communication with said conductive region. A storage electrode is formed by removing selective portions of said first conductive layer, removing said spacer layer thereby exposing a bottom surface area of said first conductive layer, conformably depositing a second conductive layer encompassing and in electrical communication with said first conductive layer and overlying said insulating layer, and etching a portion of said second conductive layer thereby isolating said second conductive layer from surrounding circuit elements. The capacitor is completed by forming a dielectric layer over said storage electrode and forming a third conductive layer which acts as a plate electrode capacitively-coupled to said storage electrode through said dielectric layer. Other devices, systems and methods are also disclosed.
REFERENCES:
patent: 4742018 (1988-05-01), Kimura et al.
patent: 5095346 (1992-03-01), Bae et al.
patent: 5142438 (1992-08-01), Reinberg et al.
patent: 5164337 (1992-11-01), Ogawa et al.
patent: 5208176 (1993-05-01), Ahmad et al.
patent: 5235199 (1993-08-01), Hamamoto et al.
"3-Dimensional Stacked Capacitor Cell for 16M and 64M DRAMS", Ema et al., International Electron Devices Meeting, Dec., 1988, pp. 592-595.
"Novel High Density, Stacked Capacitor MOS RAM", Koyanagi et al., International Electron Devices Meeting, Dec., 1978, pp. 348-351.
Arroyo Teresa M.
Brady W. James
Donaldson Richard L.
Hoel Carlton H.
Texas Instruments Incorporated
LandOfFree
Stacked DRAM structure does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Stacked DRAM structure, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Stacked DRAM structure will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1512395