Stacked DRAM structure

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

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Details

257306, 257308, 257309, H01L 27108

Patent

active

059526882

ABSTRACT:
A method of forming a microelectronic device is described comprising the steps of providing a substrate, forming a conductive region on the substrate, and forming an insulating layer on said conductive region and said substrate. The method further comprises the steps of forming a spacer layer on said insulating layer, removing selective portions of said spacer layer and said insulating layer to expose a selective area of said conductive region thereby forming a storage node contact window, and forming a first conductive layer on said spacer layer and within said storage node contact window wherein said first conductive layer is in electrical communication with said conductive region. A storage electrode is formed by removing selective portions of said first conductive layer, removing said spacer layer thereby exposing a bottom surface area of said first conductive layer, conformably depositing a second conductive layer encompassing and in electrical communication with said first conductive layer and overlying said insulating layer, and etching a portion of said second conductive layer thereby isolating said second conductive layer from surrounding circuit elements. The capacitor is completed by forming a dielectric layer over said storage electrode and forming a third conductive layer which acts as a plate electrode capacitively-coupled to said storage electrode through said dielectric layer. Other devices, systems and methods are also disclosed.

REFERENCES:
patent: 4742018 (1988-05-01), Kimura et al.
patent: 5095346 (1992-03-01), Bae et al.
patent: 5142438 (1992-08-01), Reinberg et al.
patent: 5164337 (1992-11-01), Ogawa et al.
patent: 5208176 (1993-05-01), Ahmad et al.
patent: 5235199 (1993-08-01), Hamamoto et al.
"3-Dimensional Stacked Capacitor Cell for 16M and 64M DRAMS", Ema et al., International Electron Devices Meeting, Dec., 1988, pp. 592-595.
"Novel High Density, Stacked Capacitor MOS RAM", Koyanagi et al., International Electron Devices Meeting, Dec., 1978, pp. 348-351.

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