Semiconductor device manufacturing: process – With measuring or testing
Reexamination Certificate
2006-04-18
2006-04-18
Blum, David S. (Department: 2813)
Semiconductor device manufacturing: process
With measuring or testing
C438S104000
Reexamination Certificate
active
07029931
ABSTRACT:
A technique for forming die stacks. Specifically, a stacking tip is provided to facilitate the stacking of die in a desired configuration. A first die is picked up by the stacking tip. The first die is coated with an adhesive on the underside of the die. The first die is brought in contact with a second die via the stacking tip. The second die is coupled to the first die via the adhesive on the underside of the first die. The second die is coated with an adhesive coating on the underside of the die. The second die is then brought in contact with a third die via the stacking tip. The third die is coupled to the second die via the adhesive on the underside of the second die, and so forth. Die stacks are formed without being coupled to a substrate. The die stacks may be functionally and/or environmentally tested before attaching the die stack to a substrate.
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Cobbley Chad A.
Jackson Timothy L.
Blum David S.
Fletcher Yoder
Micron Technology, inc.
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