Static information storage and retrieval – Systems using particular element – Flip-flop
Reexamination Certificate
2006-03-07
2006-03-07
Phung, Anh (Department: 2824)
Static information storage and retrieval
Systems using particular element
Flip-flop
C365S194000, C365S189040
Reexamination Certificate
active
07009871
ABSTRACT:
Systems and methods for improving the stability of memory cells. One embodiment comprises an SRAM cell which includes a first data node switchably coupled to a first bit line and a second data node switchably coupled to a second bit line. The SRAM cell is configured to be read by coupling the first data node to the first bit line and coupling the second data node to the second bit line to enable a low voltage at one of the data nodes to pull down the corresponding bit line. One of the bit lines in the memory cell is switchably coupled to a low voltage so that, when the memory cell is read, this bit line is coupled to the low voltage when the voltage at the opposing data node is high and decoupled from the low voltage when the voltage at the opposing data node is low.
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Bernstein et al;SOI circuit Design Concepts; Chapter 8.7; Kluwer Academic Publishers.
Berrier Mark L.
Kabushiki Kaisha Toshiba
Law Offices of Mark L. Berrier
Nguyen Dang T.
Phung Anh
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