Semiconductor device manufacturing: process – Gettering of substrate – By implanting or irradiating
Reexamination Certificate
2005-06-28
2005-06-28
Baumeister, B. William (Department: 2829)
Semiconductor device manufacturing: process
Gettering of substrate
By implanting or irradiating
C438S622000, C438S761000, C438S783000, C438S473000, C438S474000, C438S795000, C438S800000, C257S645000, C257S651000, C257S908000
Reexamination Certificate
active
06911378
ABSTRACT:
A process for providing regions of substantially lower fluorine content in a fluorine-containing dielectric comprises exposing the fluorine-containing dielectric to a reactive species to form volatile byproducts.
REFERENCES:
patent: 5930655 (1999-07-01), Cooney et al.
patent: 6153514 (2000-11-01), Wang et al.
patent: 6309955 (2001-10-01), Subramanian et al.
patent: 6433432 (2002-08-01), Shimizu
patent: 6448655 (2002-09-01), Babich et al.
patent: 6452251 (2002-09-01), Bernstein et al.
patent: 6699531 (2004-03-01), Fukiage
patent: 2002/0063312 (2002-05-01), Towle et al.
Conti Richard A.
Davis Kenneth
Fitzsimmons John A.
Rath David L.
Yang Dae-won
Baumeister B. William
Cantor & Colburn LLP
Jaklitsch Lisa U.
Yevsikov Victor V.
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