Static information storage and retrieval – Powering
Reexamination Certificate
2006-09-19
2006-09-19
Phung, Anh (Department: 2824)
Static information storage and retrieval
Powering
C365S154000
Reexamination Certificate
active
07110317
ABSTRACT:
An SRAM employs a virtual rail configuration that is stable against process-voltage-temperature (PVT) variation. The SRAM provides a virtual power supply voltage to an SRAM cell that is obtained by lowering a power supply voltage by a threshold voltage of a transistor and a virtual ground voltage obtained by raising a ground voltage by a threshold voltage of a transistor. Due to the use of PMOS and NMOS transistors of diode types connected between the power supply voltage and the virtual power supply voltage and the use of NMOS and PMOS transistors of diode types connected between the ground voltage and the virtual ground voltage, a virtual power supply voltage level and a virtual ground voltage level that are stable even against various PVT variations are provided, so that low-leakage current characteristics are stable.
REFERENCES:
patent: 4764897 (1988-08-01), Kameyama et al.
patent: 5274601 (1993-12-01), Kawahara et al.
patent: 5986923 (1999-11-01), Zhang et al.
patent: 6166985 (2000-12-01), McDaniel et al.
patent: 6549453 (2003-04-01), Wong
patent: 6560139 (2003-05-01), Ma et al.
patent: 6603345 (2003-08-01), Takahashi
patent: 6643173 (2003-11-01), Takemura
patent: 07-296587 (1995-11-01), None
patent: 2003-22677 (2003-01-01), None
Choi Jae-seung
Song Tae-joong
Mills & Onello LLP
Phung Anh
Samsung Electronics Co,. Ltd.
LandOfFree
SRAM employing virtual rail scheme stable against various... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with SRAM employing virtual rail scheme stable against various..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and SRAM employing virtual rail scheme stable against various... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3574789