Static information storage and retrieval – Systems using particular element – Flip-flop
Reexamination Certificate
2007-10-09
2007-10-09
Nguyen, VanThu (Department: 2824)
Static information storage and retrieval
Systems using particular element
Flip-flop
Reexamination Certificate
active
11197737
ABSTRACT:
A memory cell comprises a first inverter (IA) and a second inverter (IB) coupled upside down to each other between a first node (A) and a second node (B), and a first access transistor (TA) having a drain coupled to the first node (A), a gate coupled to a word line (WL) and a source coupled to a bit line (BLREAD). The memory cell also comprises a reference transistor (TC) having a drain coupled to the first node (A) and a source coupled to a reference line (BLREF), a cut-off potential (GND) being applied to a gate of the reference transistor (TC). Moreover, an SRAM cell comprising a reference transistor for neutralizing leakage current and associated read and write method is described.
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Fleit Kain Gibbons Gutman Bongini & Bianco P.L.
Gibbons Jon A.
Jorgenson Lisa K.
Nguyen Van-Thu
STMicroelectronics SA
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