Sputtering method and apparatus

Chemistry: electrical and wave energy – Processes and products – Coating – forming or etching by sputtering

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204298, C23C 1434

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active

049023942

ABSTRACT:
A sputtering method and apparatus for use in forming thin films on a substrate. The power output of a sputtering power source is periodically changed to a high level power and a low level power, and each film is deposited to a thickness corresponding to the integrated value of the high level power, whereby a desired thickness can be obtained in any of multilayer films having mutually different film thickness ratios.

REFERENCES:
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patent: 3860507 (1975-01-01), Vossen, Jr.
patent: 4278528 (1981-07-01), Kuehnle et al.
patent: 4284490 (1981-08-01), Weber
patent: 4294678 (1981-10-01), Kuehnle
patent: 4426267 (1984-01-01), Munz et al.
patent: 4692230 (1987-09-01), Nihei et al.
"Significant Features of Solder Connections to Gold-Plated Thin Films", by Keller, Electron Components Conf., vol. 32, pp. 346-353 1982.
"Internal Stresses and Resistivity of Low-Coltage Sputtered Tungsten Films", by Sun et al., Journal of Applied Physics, vol. 44, No. 3, Mar. 1973.

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