Sputtering apparatus and film deposition method

Chemistry: electrical and wave energy – Processes and products – Coating – forming or etching by sputtering

Reexamination Certificate

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Details

C204S192130, C204S298030, C204S298110, C204S298230, C204S298280, C204S298290, C204S298190, C204S298170

Reexamination Certificate

active

07955480

ABSTRACT:
The present invention provides a sputtering apparatus and a film deposition method capable of forming a magnetic film with reduced variations in the direction of magnetic anisotropy. The sputtering apparatus of the present invention is provided with a rotatable cathode (802), a rotatable stage (801) and a rotatable shielding plate (805). The sputtering apparatus controls the rotation of at least one of the cathode (802), stage (801) and shielding plate (805) so that sputtered particles impinging at an angle formed with respect to a normal line of the substrate (804) of 0° or more and 50° or less out of sputtered particles generated from the target (803a) during sputtering are made to impinge on the substrate (804).

REFERENCES:
patent: 5962080 (1999-10-01), Tan et al.
patent: 6224718 (2001-05-01), Meyer
patent: 2008/0011602 (2008-01-01), Ota et al.
patent: 63-257941 (1988-10-01), None
patent: 6-271400 (1994-09-01), None
patent: 7-54145 (1995-02-01), None
patent: 8-296042 (1996-11-01), None
patent: 11-200040 (1999-07-01), None
patent: 2002-266071 (2002-09-01), None
patent: 2008-019498 (2008-01-01), None

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