Spin-polarized scanning tunneling microscope

Details Spin-polarized scanning tunneling microscope Spin-polarized scanning tunneling microscope

1989-08-10

1991-01-15

Berman, Jack I.

Radiant energy

Inspection of solids or liquids by charged particles

250307, H01J 3726

Patent

active

049856278

ABSTRACT:
In a scanning tunneling microscope, the tunnel tip comprises an optically transparent body coated with a semiconductor layer, such as a GaAs layer. A sample being investigated comprises a magnetic material. Tunnel microscope operation permits investigation of the magnetic properties at or near the surface of the sample where a spin-polarized beam of light impinges upon the sample surface, through the transparent body of the tunnel tip, or after traveling through the sample, or when made to impinge upon the surface at an angle of incidence from an axis normal to the sample surface. In addition to conventional scanning tunneling microscope electronics, an oscillator-controlled phase-sensitive detector or gating means and a display unit are provided for direct viewing of the magnetic properties and the topography of the sample.

REFERENCES:
patent: 4343993 (1982-08-01), Binnig et al.
patent: 4837435 (1989-06-01), Sakuhara et al.

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