Optics: measuring and testing – Surface roughness
Reexamination Certificate
2008-04-22
2008-04-22
Lauchman, Layla G. (Department: 2877)
Optics: measuring and testing
Surface roughness
C356S237200, C356S612000
Reexamination Certificate
active
11318103
ABSTRACT:
An apparatus and a method for detecting low frequency specular surface flaws on coated substrates is disclosed. A method for detecting low frequency specular surface flaws may comprise: impinging visible electromagnetic radiation or light from an electromagnetic radiation source onto the coated substrate at an oblique angle, reflecting the visible electromagnetic radiation off the coated substrate onto a screen material to form a specular surface flaw reflected image, and recording the reflected image off the screen material with a photosensitive device to form a recorded reflected image.
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Gottschalk Ken
Pietrantoni Dante
Pietrzykowski Stanley
Zaman Kamran
Lauchman Layla G.
Pepper Hamilton LLP
Valentin Juan D
Xerox Corporation
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