Optics: measuring and testing – Surface roughness
Reexamination Certificate
2008-04-22
2008-04-22
Lauchman, Layla G. (Department: 2877)
Optics: measuring and testing
Surface roughness
C356S237200, C356S612000
Reexamination Certificate
active
07362450
ABSTRACT:
An apparatus and a method for detecting low frequency specular surface flaws on coated substrates is disclosed. A method for detecting low frequency specular surface flaws may comprise: impinging visible electromagnetic radiation or light from an electromagnetic radiation source onto the coated substrate at an oblique angle, reflecting the visible electromagnetic radiation off the coated substrate onto a screen material to form a specular surface flaw reflected image, and recording the reflected image off the screen material with a photosensitive device to form a recorded reflected image.
REFERENCES:
patent: 4185921 (1980-01-01), Godai et al.
patent: 4715709 (1987-12-01), Sekine et al.
patent: 4794264 (1988-12-01), Quackenbos et al.
patent: 4794265 (1988-12-01), Quackenbos et al.
patent: 4853777 (1989-08-01), Hupp
patent: 4929846 (1990-05-01), Mansour
patent: 5086232 (1992-02-01), Maguire et al.
patent: 5125741 (1992-06-01), Okada et al.
patent: 5127726 (1992-07-01), Moran
patent: 5153844 (1992-10-01), Beni et al.
patent: 5225890 (1993-07-01), Lee et al.
patent: 5557402 (1996-09-01), Osawa et al.
patent: 5815773 (1998-09-01), Zaman
patent: 6046801 (2000-04-01), Liu et al.
patent: 6373565 (2002-04-01), Kafka et al.
patent: 6603542 (2003-08-01), Chase et al.
patent: 6963076 (2005-11-01), Zaman et al.
patent: 7099002 (2006-08-01), Ishiura et al.
patent: 2005/0202330 (2005-09-01), Tong et al.
patent: 07-128240 (1995-05-01), None
patent: 07-128241 (1995-05-01), None
patent: 09-325120 (1997-12-01), None
Gottschalk Ken
Pietrantoni Dante
Pietrzykowski Stanley
Zaman Kamran
Lauchman Layla G.
Pepper Hamilton LLP
Valentin Juan D
Xerox Corporation
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