Specular surface flaw detection

Optics: measuring and testing – Surface roughness

Reexamination Certificate

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Details

C356S237200, C356S612000

Reexamination Certificate

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07362450

ABSTRACT:
An apparatus and a method for detecting low frequency specular surface flaws on coated substrates is disclosed. A method for detecting low frequency specular surface flaws may comprise: impinging visible electromagnetic radiation or light from an electromagnetic radiation source onto the coated substrate at an oblique angle, reflecting the visible electromagnetic radiation off the coated substrate onto a screen material to form a specular surface flaw reflected image, and recording the reflected image off the screen material with a photosensitive device to form a recorded reflected image.

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