Specimen holder, specimen inspection apparatus, specimen...

Details Specimen holder, specimen inspection apparatus, specimen... Specimen holder, specimen inspection apparatus, specimen...

2008-01-31

2010-06-29

Wells, Nikita (Department: 2881)

Radiant energy

Inspection of solids or liquids by charged particles

Analyte supports

C250S440110, C250S306000, C250S307000, C250S310000, C250S311000, C250S309000, C073S864910

Reexamination Certificate

active

07745802

ABSTRACT:
A specimen holder, a specimen inspection apparatus, and a specimen inspection method permitting a specimen consisting of cultured cells to be observed or inspected. Also, a method of fabricating the holder is offered. The holder has an open specimen-holding surface. At least a part of this surface is formed by a film. A specimen cultured on the specimen-holding surface of the film can be irradiated via the film with a primary beam for observation or inspection of the specimen. Consequently, the cultured specimen (e.g., cells) can be observed or inspected in vitro. Especially, if an electron beam is used as the primary beam, the specimen in vitro can be observed or inspected by SEM. Because the specimen-holding surface is open, a manipulator can gain access to the specimen. A stimulus can be given to the specimen using the manipulator. The reaction can be observed or inspected.

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Green, Evan Drake Harriman, Ph.D, Chapter 1. Introduction, Atmospheric Scanning Electron Microscopy, Stanford University, pp. 1-12, 1993.

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