Specimen holder, specimen inspection apparatus, and specimen...

Details Specimen holder, specimen inspection apparatus, and specimen... Specimen holder, specimen inspection apparatus, and specimen...

2009-06-04

2011-10-04

Wells, Nikita (Department: 2881)

Radiant energy

Inspection of solids or liquids by charged particles

Analyte supports

C250S442110, C250S306000, C250S310000, C250S311000, C250S309000, C073S864910

Reexamination Certificate

active

08030622

ABSTRACT:
A specimen holder is offered which can reduce the amount of chemical sprayed over a specimen consisting of cultured cells. The specimen holder has an open specimen-holding surface. At least a part of the specimen-holding surface is formed by a film and a tapering portion formed around the film. The specimen can be cultured on the specimen-holding surface of the film. The presence of the tapering portion can reduce the amount of used reagent. The specimen can be irradiated via the film with a primary beam for observation or inspection of the specimen. Consequently, the specimen, such as cells, can be well observed or inspected in vivo while the specimen is being cultured. Especially, if an electron beam is used as the primary beam, the specimen can be well observed or inspected in vivo by SEM (scanning electron microscopy).

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Green, Evan Drake Harriman, Ph.D., “Atmospheric Scanning Electron Microscopy,” Chapter 1: Introduction, Stanford University, 1993, pp. 1-12.

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