Specimen holder for an electron microscope and method for...

Details Specimen holder for an electron microscope and method for... Specimen holder for an electron microscope and method for...

2007-07-03

2007-07-03

Wells, Nikita (Department: 2881)

Radiant energy

Inspection of solids or liquids by charged particles

Analyte supports

C250S443100, C250S311000, C250S442110

Reexamination Certificate

active

10519293

ABSTRACT:
A specimen holder for an electron microscope, comprising a rod-shaped part, which is provided near one end with a tip, which tip is arranged to receive a specimen, the rod-shaped part, in use, extending with at least the tip into the electron microscope, held by clamping means present in the electron microscope, wherein first temperature control means are provided to control the temperature of the rod-shaped part and/or the clamping means, such that this rod-shaped pan and the clamping means substantially have the same temperature, at least at the location of their contact surfaces.

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patent: 5753924 (1998-05-01), Swann
patent: 5986270 (1999-11-01), Bormans et al.
patent: 6410925 (2002-06-01), Armbruster et al.
patent: 2 126 623 (1972-12-01), None
patent: 0 538 861 (1993-04-01), None
patent: 62172246 (1987-07-01), None

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