Solid state storage end of life prediction with correction...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing

Reexamination Certificate

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C714S002000, C714S005110, C714S006130, C714S025000, C714S030000, C714S031000, C714S042000, C714S704000, C714S718000, C714S721000, C714S745000, C711S102000, C711S103000, C365S185010, C365S185330

Reexamination Certificate

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07975193

ABSTRACT:
Described embodiments provide for end-of-life (EOL) checking for NAND flash devices. An exemplary implementation of a computing environment comprises at least one NAND data storage device operative to store one or more data elements. In the illustrative implementation, the EOL data processing and storage management paradigm allows for the storage of data according using a selected EOL enforcement algorithm that can utilize current and/or historical correction levels. The NAND data storage EOL checking module can be operable to cooperate with one or more NAND data store components to execute one or more selected EOL operations to protect stored data.

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