Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate
2011-07-05
2011-07-05
Trimmings, John P (Department: 2117)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Memory testing
C714S002000, C714S005110, C714S006130, C714S025000, C714S030000, C714S031000, C714S042000, C714S704000, C714S718000, C714S721000, C714S745000, C711S102000, C711S103000, C365S185010, C365S185330
Reexamination Certificate
active
07975193
ABSTRACT:
Described embodiments provide for end-of-life (EOL) checking for NAND flash devices. An exemplary implementation of a computing environment comprises at least one NAND data storage device operative to store one or more data elements. In the illustrative implementation, the EOL data processing and storage management paradigm allows for the storage of data according using a selected EOL enforcement algorithm that can utilize current and/or historical correction levels. The NAND data storage EOL checking module can be operable to cooperate with one or more NAND data store components to execute one or more selected EOL operations to protect stored data.
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LSI Corporation
Trimmings John P
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