Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2008-05-13
2008-05-13
Quach, T. N. (Department: 2826)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S440000, C257SE27135
Reexamination Certificate
active
07372089
ABSTRACT:
A solid-state image sensing device provided with photoelectric conversion films stacked above a semiconductor substrate, comprising: first impurity regions as defined herein; second impurity regions as defined herein; signal charge reading regions as defined herein; and third impurity regions as defined herein.
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patent: 2002-83946 (2002-03-01), None
Inoue Tomoki
Uya Shinji
FUJIFILM Corporation
Quach T. N.
Sughrue & Mion, PLLC
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