Solid state image pickup device and manufacturing method...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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Details

C257S292000, C257S432000, C257SE31127

Reexamination Certificate

active

07427789

ABSTRACT:
A method of manufacturing a solid-state image pickup device comprises a process for forming a plurality of photoelectric conversion elements PD within a semiconductor substrate4, a process for forming an interconnection portion, having an interconnection layer8in an insulating layer7, on the surface side of the semiconductor substrate4, a process for forming an adhesive layer, made of a material cured at a temperature lower than a deterioration starting temperature of the interconnection layer8, on the surface of the interconnection portion and bonding a supporting substrate30to the surface side of the interconnection portion through the adhesive layer9by heat treatment at a temperature lower than the deterioration starting temperature of the interconnection layer8and a process for decreasing a thickness of the semiconductor substrate4from the back side. A solid-state image pickup device manufacturing method can bond the supporting substrate30to the surface side of the interconnection portion through the adhesive layer9without exerting a thermal influence upon the interconnection layer8that was previously formed on the surface side of the semiconductor substrate4.

REFERENCES:
patent: 6492198 (2002-12-01), Hwang
patent: 2003/0042424 (2003-03-01), Eberhard et al.
patent: 2003/0132510 (2003-07-01), Barth et al.
patent: 05-094929 (1993-04-01), None
patent: 05-313201 (1993-11-01), None
patent: 06-326293 (1994-11-01), None
patent: 09-260699 (1997-10-01), None
patent: 09-298287 (1997-11-01), None
patent: 2003-031785 (2003-01-01), None

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