Solder flow stops for semiconductor die substrates

Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Configuration or pattern of bonds

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C257S779000, C257S731000, C257SE23020

Reexamination Certificate

active

07615873

ABSTRACT:
A substrate, which has semiconductor die arranged thereon, uses at least one solder flow stop, closely surrounding at least a portion of at least one mounting pad on which the die are mounted, to prevent die rotation during solder reflow. The at least one solder stop is non-wetting, during a solder reflow process, to solder used to mount the die.

REFERENCES:
patent: 4183611 (1980-01-01), Casciotti et al.
patent: 4908689 (1990-03-01), McBride et al.
patent: 5152451 (1992-10-01), Darveaux et al.
patent: 5186383 (1993-02-01), Melton et al.
patent: 5281684 (1994-01-01), Moore et al.
patent: 5282565 (1994-02-01), Melton
patent: 5327013 (1994-07-01), Moore et al.
patent: 5390080 (1995-02-01), Melton et al.
patent: 5400950 (1995-03-01), Myers et al.
patent: 5410184 (1995-04-01), Melton et al.
patent: 5452842 (1995-09-01), Melton et al.
patent: 6189203 (2001-02-01), Heinrich et al.
patent: 6310301 (2001-10-01), Heinrich et al.
patent: 6391678 (2002-05-01), Paszkiet et al.
patent: 6402012 (2002-06-01), Bolduc
patent: 6436730 (2002-08-01), Melton et al.
patent: 6531663 (2003-03-01), Isenberg et al.
patent: 6696764 (2004-02-01), Honda
patent: 6747875 (2004-06-01), Wildrick et al.
patent: 6750084 (2004-06-01), Delheimer
patent: 6841887 (2005-01-01), Araki
patent: 2002/0036345 (2002-03-01), Iseki et al.
patent: 2002/0084521 (2002-07-01), Coyle et al.
patent: 2006/0103005 (2006-05-01), Schulz-Harder et al.
L. Halbo, “Electronic Components, Packaging and Production,” Chapter 3, pp. 3.1-3.53, 1993; revised 1995, Printed by Strandberg & Nilsen Grafisk.
D.H. Carey, “Trends in low-cost, high-performance substrate technology,” abstract, IEEE Micro, 13(2):19-27, Apr. 1993, 2005 Institution of Electrical Engineers, Dialog® File No. 2, Accession No. 4423478.
S.E. Larson et al., “Comparison of various substrate technologies under steady state and transient conditions,” abstract, The Ninth Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (IEEE Cat. No. 04CH37543), vol. 2, pp. 648-654, 2005 Institution of Electrical Engineers, Dialog® File No. 2, Accession No. 8117972.
T. Senese, “Trends in electronic substrate technology,” abstract, Electronic Packaging and Production, 30(9):40-43, Sep. 1990, 2005 Institution of Electrical Engineers, Dialog® File No. 2, Accession No. 3803127.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Solder flow stops for semiconductor die substrates does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Solder flow stops for semiconductor die substrates, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Solder flow stops for semiconductor die substrates will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4071452

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.