Semiconductor device manufacturing: process – Formation of electrically isolated lateral semiconductive... – Total dielectric isolation
Reexamination Certificate
2009-07-06
2011-10-04
Pert, Evan (Department: 2826)
Semiconductor device manufacturing: process
Formation of electrically isolated lateral semiconductive...
Total dielectric isolation
C257SE21094
Reexamination Certificate
active
08030169
ABSTRACT:
An object is to provide an SOI substrate provided with a semiconductor layer which can be used practically even when a glass substrate is used as a base substrate. Another object is to provide a semiconductor device having high reliability using such an SOI substrate. An altered layer is formed on at least one surface of a glass substrate used as a base substrate of an SOI substrate to form the SOI substrate. The altered layer is formed on at least the one surface of the glass substrate by cleaning the glass substrate with solution including hydrochloric acid, sulfuric acid or nitric acid. The altered layer has a higher proportion of silicon oxide in its composition and a lower density than the glass substrate.
REFERENCES:
patent: 5371037 (1994-12-01), Yonehara
patent: 5374564 (1994-12-01), Bruel
patent: 5492843 (1996-02-01), Adachi et al.
patent: 5837619 (1998-11-01), Adachi et al.
patent: 5876497 (1999-03-01), Atoji
patent: 6008076 (1999-12-01), Codama et al.
patent: 6103009 (2000-08-01), Atoji
patent: 6127702 (2000-10-01), Yamazaki et al.
patent: 6271101 (2001-08-01), Fukunaga
patent: 6335231 (2002-01-01), Yamazaki et al.
patent: 6380046 (2002-04-01), Yamazaki
patent: 6388652 (2002-05-01), Yamazaki et al.
patent: 6479334 (2002-11-01), Codama et al.
patent: 6602761 (2003-08-01), Fukunaga
patent: 6686623 (2004-02-01), Yamazaki
patent: 6778164 (2004-08-01), Yamazaki et al.
patent: 6803264 (2004-10-01), Yamazaki et al.
patent: 6875633 (2005-04-01), Fukunaga
patent: 6908797 (2005-06-01), Takano
patent: 7119365 (2006-10-01), Takafuji et al.
patent: 7176525 (2007-02-01), Fukunaga
patent: 7176528 (2007-02-01), Couillard et al.
patent: 7192844 (2007-03-01), Couillard et al.
patent: 7199024 (2007-04-01), Yamazaki
patent: 7256776 (2007-08-01), Yamazaki et al.
patent: 7399681 (2008-07-01), Couillard et al.
patent: 7476940 (2009-01-01), Couillard et al.
patent: 7605053 (2009-10-01), Couillard et al.
patent: 7795627 (2010-09-01), Yamazaki
patent: 7829431 (2010-11-01), Tanaka
patent: 7838935 (2010-11-01), Couillard et al.
patent: 7851318 (2010-12-01), Koyama et al.
patent: 7863155 (2011-01-01), Yamazaki et al.
patent: 2004/0104424 (2004-06-01), Yamazaki
patent: 2005/0009252 (2005-01-01), Yamazaki et al.
patent: 2005/0260800 (2005-11-01), Takano
patent: 2007/0063281 (2007-03-01), Takafuji et al.
patent: 2007/0087488 (2007-04-01), Moriwaka
patent: 2007/0108510 (2007-05-01), Fukunaga
patent: 2007/0173000 (2007-07-01), Yamazaki
patent: 2007/0184632 (2007-08-01), Yamazaki et al.
patent: 2007/0281440 (2007-12-01), Cites et al.
patent: 2007/0291022 (2007-12-01), Yamazaki et al.
patent: 2008/0246109 (2008-10-01), Ohnuma et al.
patent: 2008/0268618 (2008-10-01), Yamazaki
patent: 11-163363 (1999-06-01), None
patent: 2004-087606 (2004-03-01), None
Kakehata Tetsuya
Makino Kenichiro
Ohnuma Hideto
Yamamoto Yoshiaki
Pert Evan
Robinson Eric J.
Robinson Intellectual Property Law Office P.C.
Semiconductor Energy Laboratory Co,. Ltd.
LandOfFree
SOI substrate and manufacturing method thereof does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with SOI substrate and manufacturing method thereof, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and SOI substrate and manufacturing method thereof will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4278746