Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Patent
1998-03-05
2000-06-20
Dutton, Brian
Active solid-state devices (e.g., transistors, solid-state diode
Test or calibration structure
257347, H01L 2358, H01L 2701, H01L 2712, H01L 310392
Patent
active
060780584
ABSTRACT:
Apparatus and method for discharging the body of a monitored SOI device through first and second discharge circuits. The second discharge circuit is selectively activated when the body potential of the monitored SOI device is at a level such that the body charge of the monitored SOI device cannot be discharged entirely through the first discharge circuit within normal operating cycle time allowances.
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Hsu Louis L.
Kuang Jente B.
Ratanaphanyarat Somnuk
Saccamango Mary J.
Abate Joseph P.
Dutton Brian
International Business Machine Corporation
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