Soft passivation layer in semiconductor fabrication

Active solid-state devices (e.g. – transistors – solid-state diode – Integrated circuit structure with electrically isolated... – Passive components in ics

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257530, 257209, H01L 27082, H01L 27102, H01L 2970, H01L 3111

Patent

active

061277215

ABSTRACT:
The use of an etch stop layer to define a terminal via opening to access a device feature after formation of a photosensitive soft-passivation layer. The etch stop layer allows the size of the terminal via opening to be decoupled from the resolution capabilities of current photosensitive soft-passivation layer.

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