Electrical connectors – With magnet – To urge mating connectors together
Reexamination Certificate
2007-11-14
2008-09-02
Hyeon, Hae Moon (Department: 2839)
Electrical connectors
With magnet
To urge mating connectors together
C439S066000
Reexamination Certificate
active
07419378
ABSTRACT:
Example embodiments of the present invention include a socket for testing a semiconductor package. The socket comprises a body having a through hole. A lower magnet is disposed in a lower region of the through hole, and a first type magnetic pole of the lower magnet is directed upward. An upper magnet is disposed in an upper region of the through hole, wherein the first type magnetic pole of the upper magnet is directed toward the lower magnet. The upper and lower magnets are structured to absorb a shock wave which is generated when the semiconductor package is arranged for testing. A conductive medium is disposed between the lower magnet and the upper magnet to electrically couple contactors of the semiconductor package to a base substrate of the socket.
REFERENCES:
patent: 7097461 (2006-08-01), Neidlein
patent: 7190180 (2007-03-01), Yamada et al.
patent: 2007/0134947 (2007-06-01), Neidlein
patent: 2006-084252 (2006-03-01), None
patent: 2002-0024419 (2002-03-01), None
patent: 2002-0037484 (2002-05-01), None
English language abstract of Korean Publication No. 2002-0024419.
English language abstract of Korean Publication No. 2002-0037484.
English language abstract of Japanese Publication No. 2006-084252.
Ha Seoung-Su
Kang Jin-Won
Kim Jung-Hyeon
Yu Se-Jun
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