Electrical connectors – Preformed panel circuit arrangement – e.g. – pcb – icm – dip,... – With provision to conduct electricity from panel circuit to...
Reexamination Certificate
2007-01-23
2009-02-03
Nguyen, Truc T (Department: 2833)
Electrical connectors
Preformed panel circuit arrangement, e.g., pcb, icm, dip,...
With provision to conduct electricity from panel circuit to...
C324S1540PB
Reexamination Certificate
active
07484968
ABSTRACT:
A socket for an electrical tester is disclosed. The socket includes a first contact board being arranged at a bottom side of a test object, and a second contact board being arranged at a top side of the test object. The first contact board includes a first contact member and a first conductive connection member, wherein the first contact member is electrically connected to a bottom connection terminal formed on the bottom side of the test object, and the first conductive connection member is isolated from the test object. The second contact board includes a second contact member, wherein the second contact member is electrically connected to the first conductive connection member and a top connection terminal formed on a top side of the test object, respectively. Therefore, the socket can have a simple configuration for providing the test current.
REFERENCES:
patent: 4912400 (1990-03-01), Plante
patent: 2002-214286 (2002-07-01), None
patent: 20010087642 (2001-09-01), None
patent: 20020064060 (2002-08-01), None
Mills & Onello LLP
Nguyen Truc T
Samsung Electronics Co,. Ltd.
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