SMI memory read data capture margin characterization...

Details SMI memory read data capture margin characterization... SMI memory read data capture margin characterization...

2008-06-27

2010-11-09

Luu, Pho M (Department: 2824)

Static information storage and retrieval

Read/write circuit

Testing

C365S191000, C365S194000, C365S233500

Reexamination Certificate

active

07830737

ABSTRACT:
The present invention is directed to margin characterization of memory devices, such as interface ASICs connected to SDRAM. The circuits and method perform margin characterization on a chip during wafer test; however the characterization could also be performed at module test or in a system.

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