Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate
2007-07-10
2007-07-10
Chung, Phung My (Department: 2138)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Memory testing
C365S201000
Reexamination Certificate
active
11304961
ABSTRACT:
A “smart verify” technique, whereby multi-state memories are programmed using a verify-results-based dynamic adjustment of the multi-states verify range for sequential-state-based verify implementations, is presented. This technique can increase multi-state write speed while maintaining reliable operation within sequentially verified, multi-state memory implementations by providing “intelligent” element to minimize the number of sequential verify operations for each program/verify/lockout step of the write sequence. At the beginning of a program/verify cycle sequence only the lowest state or states are checked during the verify phase. As lower states are reached, additional higher states are added to the verify sequence and lower states can be removed.
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Notification of Transmittal of the International Search Report or the Declaration, International Application No. PCT/US03/38076 for SanDisk Corporation mailed Apr. 23, 2004.
Communication Pursuant to Article 96(2) EPC for Application No. 03 787 219.9-2210, mailed Oct. 10, 2005, 3 pages.
Fong Yupin Kawing
Gongwer Geoffrey S.
Guterman Daniel C.
Chung Phung My
Davis , Wright, Tremaine, LLP
SanDisk Corporation
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