Small cavity analytical instruments

Details Small cavity analytical instruments Small cavity analytical instruments

1994-07-29

1996-09-24

Berman, Jack I.

Radiant energy

Inspection of solids or liquids by charged particles

25044011, 324636, H01J 3720

Patent

active

055593283

ABSTRACT:
A sample and the tip portion of an alternating current scanning tunneling microscope are electrically enclosed within a cavity with electrically conductive walls. The dimensions of the cavity are smaller than the wavelength of a component of the AC signal applied by the probe to the sample so that the output signal detected by the probe from the sample will not be contaminated by resonant effects of the cavity.

REFERENCES:
patent: 3566262 (1971-02-01), Thompson et al.
patent: 4941753 (1990-07-01), Wickramasinghe
patent: 5060248 (1991-10-01), Dumoulin
patent: 5268573 (1993-12-01), Weiss et al.
patent: 5281814 (1994-01-01), Weiss et al.
"Scanning Tunneling Microscope Instrumentation," Kuk et al., Rev. Sci. Instrum. 60(2):165-180, Feb. 1989.
"Fields and Waves in Communication Electronics," Ramo et al., Second Edition, Section 10.2, pp. 486-522.
"A Tunable Microwave Frequency Alternating Current Scanning Tunneling Microscope," by Stranick et al., Review of Scientific Instruments, vol. 65, No. 4, Part 1, Apr. 1994.
"Alternating Current Scanning Tunneling Microscopy and Nonlinear Spectroscopy," Stranick et al., Journal of Physical Chemistry, vol. 98, No. 7, pp. 1762-1764.
"Analytical Applications of Scanning Tunneling Microscopy," Weiss, reprinted from TRAC--Trends in Analytical Chemistry, Elsevier, pp. 61-67.
"Carrier Excitation by Atomic Collisions at Semiconductor Surfaces," Weiss et al., Physical Review B, vol. 38(14):9928-9935, Nov. 15, 1988.
"Alternating Current Scanning Tunneling Spectroscopy of Self-Assembled Monolayers on Gold," Stranick et al., Journal of Vacuum Science & Technology A, Second Series, vol. 11, No. 4, Part 1, Jul./Aug. 1993.
"Scanning Force microscopy (SFM)," Meyer et al., Analytical Corner, Springer Series in Surfaces Sciences.
Advertisement entitled "Conductive Silicone Elastomers," 2 pages.
"Nanosources and Manipulation of Atoms Under High Fields and Temperatures: Applications," edited by Binh et al., NATO ASI Series, Series E: Applied Sciences, vol. 235, pp. 19-33.
"Generation of Microwave Radiation in the Tunneling Junction of a Scanning Tunneling Microscope," by Krieger et al., The American Physical Society, vol. 41, No. 14, May 15, 1990, pp. 10229-10232.
"A New Impedance Spectrometer for the Investigation of Electrochemical Systems," by Popkirov et al., Rev. Sci. Instrum., vol. 63, No. 11, pp. 5366-5372.
"Scanning Tunneling Microscopy, Resonant Tunneling, and Counting Electrons: A Quantum Standard of Current," by Guinea et al., Physical Review Letters, vol. 65, No. 3, pp. 281-284, Jul. 16, 1990.
"AC Scanning Tunneling Microscopy and Spectroscopy," by Stranick et al., Version Date Aug. 28, 1992.
"Near-Field Optics: Microscopy, Spectroscopy, and Surface Modification Beyond . . . ," Betzig et al., Science, V. 25, pp. 189-195, Jul. 10, 1992.
"Breaking the Diffraction Barrier: Optical Microscopy on a Nanometric Scale," Betzig et al., Science, V. 251, pp. 1468-1470, Mar. 22, 1991.
"Super-Resolution Aperture Scanning Microscope," Weiss, Nature, V. 237, pp. 510-512, Jun. 10, 1972.
"Scanning Surface Harmonic Microscopy: Scanning Probe Microscopy . . . , " Michel et al., Rev. Sci. Instrum., V. 63, No. 9, pp. 4080-4085, Sep. 1992.
"Nonlinear Alternating-Current Tunneling Microscopy," Kochanski, Physical Review Letters, 62(19):2285-2288 (May 8, 1989).
"Nonlinear Alternating-Current Tunneling Microscopy (AT&T Preprint (Aug. 17, 1988))", published in Phys. Rev. Ltrs, 62(19):2285-2288 (May 8, 1989).
"Scanning Tunneling Microscopy at Microwave Frequencies," Ultramicroscopy, Seifert et al., pp. 42-44; 379-387 (1992).
"Scanning Tunneling Microscopy at Microwave Frequencies," Ultramicroscopy, (Preprint, Korrigierte Version, Nov. 6, 1991), pp. 42-44; 379-387 (1992).
"Scanning Tunneling Microscopy I," Anselmetti et al., pp. 5-6.
"Laser-Frequency Mixing Using the Scanning Tunneling Microscope," Arnold et al J. Vac. Sci. Technol., A, 6(2):466-469 (Mar./Apr. 1988).
"Laser-Frequency Mixing in the Junction of a Scanning Tunneling Microscope," Appl. Phys. Lett., 51(11)786-788 (Sep. 14, 1987), Arnold et al.
"Laser-Driven Scanning Tunneling Microscope," Volcker et al., Phys. Rev. Lett., 66(13)1717-1720 (Apr. 1, 1991).
"Scanning Tunneling Microscopy of Photoexcited Carriers at the Si(001) Surface," Cahill et al., J. Vac. Sci. Techn., B, 9(2):564-567 (Mar./Apr. 1991).
"Atomically Resolved Carrier Recombination at Si(111)-(7.times.7) Surfaces," Hamers et al., Phys. Rev. Lett., 64(9):1051-1054 (Feb. 26, 1990).
"Optical Interactions in the Junction of a Scanning Tunneling Microscope," Kuk et al., Phys. Rev. Lett., 65(4):456-459 (1990).
"Correlated Discrete Transfer of Single Electrons in Ultrasmall Tunnel Junctions," Likharev, IBM J. Res. Develop., 32(1):144-158 (Jan. 1988).
"Single Electronics," Likharev et al., Scientific American, Jun. 1992.
"Ultramicroelectrodes: Cyclic Volammetry Above One Million Vs", J. Electro anal. Chem., 248:447-450 (1988).
"High-Speed Cyclic Voltammetry," Wightman et al., Acc. Chem. Res., 23:64-70 (1990).
"Single Charge Tunneling Coulomb Blockade Phenomena . . . ," Grabert et al., NATO ASI Series, Series B: Physics, vol. 294, pp. 1-19, 1992.
"Time-Correlated Single-Electron Tunneling in One-Dimensional Arrays of Ultrasmall . . . ," Delsing et al., Phys. Rev. Lett., 63(17):1861-1864, Oct. 23, 1989.
G. Meijer et al., Nature, 348, 621 (1990).
"A Versatile Microwave-Frequency-Compatible Scanning Tunneling Microscope," Stranick et al., Rev. Sci. Instrum., 64(5):1232-1234, May 1993.
"Coarse Tip Distance Adjustment and Positioner for a Scanning Tunneling Microscope," Frohn et al., Rev. Sci. Instrum., 60(6):1200-1201, Jun. 1989.
"Nanosources and Manipulation of Atoms Under High Fields and Temperatures: Applications," edited by Binh et al., NATO ASI Series, V. 235, pp. 19-33.
Product brochure entitled "The Beetle STM-A Versatile, UHV Compatible Scanning Tunneling Microcope".
"An Easily Operable Scanning Tunneling Microscope," Besocke, Surface Science, 181:145-153, 1987.

Affiliated with

Also associated with

Rating

Small cavity analytical instruments does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Small cavity analytical instruments, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Small cavity analytical instruments will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1930358