Small area magnetic memory devices

Static information storage and retrieval – Read/write circuit – Including magnetic element

Reexamination Certificate

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Details

C365S171000, C365S158000, C365S173000, C365S189070

Reexamination Certificate

active

06781910

ABSTRACT:

FIELD OF THE INVENTION
The present disclosure relates to memory devices. More particularly, the disclosure relates to magnetic memory devices that have relatively small areas.
BACKGROUND OF THE INVENTION
Magnetic memory such as magnetic random access memory (MRAM) is a non-volatile, semiconductor-based memory technology in which magnetic, rather than electrical, charges are used to store bits of data. In addition to offering non-volatility, magnetic memory devices are very fast and consume little power.
An example of a known magnetic memory device
100
is illustrated in FIG.
1
. As shown in this figure, the magnetic memory device
100
comprises a plurality of memory cells or bits
102
that are arranged in a two-dimensional array. A relatively small number of these memory cells
102
have been depicted in
FIG. 1
for purposes of explanation. Normally, the magnetic memory device
100
comprises many more such cells
102
. For instance, the device
100
may comprise a 1024×1024 array of memory cells
102
. Each memory cell
102
is configured to store a single bit of information, i.e., a logic value “1” or a logic value “0.”
As is further illustrated in
FIG. 1
, the magnetic memory device
100
also comprises a plurality of column conductors
104
and row conductors
106
that are electrically coupled to the memory cells
102
. Specifically, each memory cell
102
is connected to a column conductor
104
and a row conductor
106
at a cross-point of the conductors. Additionally, the magnetic memory device
100
includes column and row control circuits
108
and
110
which control switching for the various column and row conductors
104
and
106
, respectively.
FIG. 2
provides a detailed view of a single memory cell
102
and its connection to its associated column and row conductor
104
and
106
. As is evident from
FIG. 2
, each memory cell
102
typically comprises two magnetic layers
200
and
202
that are separated by a thin insulating layer
204
. One of the magnetic layers (e.g., the bottom magnetic layer
202
) has a fixed magnetic orientation, while the other magnetic layer (e.g., the top magnetic layer
200
) has a “free” magnetic orientation that can be relatively easily toggled from an orientation in which it aligns with the orientation of the fixed magnetic layer to an orientation in which it opposes the orientation of the fixed magnetic layer. The first state (aligned) of the memory cell
102
is called the “parallel” state and the second state (opposed) is called the “anti-parallel” state.
The two different memory cell states can be used to record data due to their disparate effect on resistance of the memory cell
102
. Specifically, the memory cell
102
has a relatively small resistance when in the parallel state, but has a relatively high resistance when in the anti-parallel state. By way of example, the parallel state can be designated as representing a logic value “1” while the anti-parallel state can be designated as representing a logic value “0.” In such a scheme, the magnetic memory device
100
can be written by changing the magnetic orientation of the free magnetic layer
200
of selected memory cells
102
.
The control circuits
108
and
110
are used to facilitate selection of any given memory cell
102
during reading and writing. Normally, these circuits
108
,
110
include a plurality of switches, for instance transistors, that are used to apply voltage to or provide current flow through selected conductors.
FIG. 3
illustrates a switching arrangement
300
for a magnetic memory device of the type described above in relation to
FIGS. 1 and 2
. As indicated in
FIG. 3
, the memory cells are represented as resistors
302
that are electrically coupled to column conductors
304
and row conductors
306
. At both ends of each conductor
304
,
306
is a read/write transistor
308
that is used to select the various memory cells
302
during reading and writing.
To write data to a memory cell
302
, current flow is provided through the column conductor
304
and row conductor
306
associated with a particular memory cell. For instance, if it is desired to write to the upper left memory cell
302
illustrated in
FIG. 3
, a current is provided to the leftmost column conductor
304
and the topmost row conductor
306
simultaneously. By way of example, the flow of current through the conductors is facilitated by providing a write voltage, V
WR
, to one end of each of the conductors and connecting the opposite end of each conductor to ground via the transistors
308
. The magnetic fields created by the flow of electrons through the conductors
304
and
306
cause the orientation of the free layer (e.g., layer
200
in
FIG. 2
) of the memory cell
302
to change to, therefore, change the state of the cell.
Under one example reading scheme, the conductors
304
,
306
associated with each unselected memory cell
302
are provided with a reference voltage, V
A
, and, simultaneously, one of the conductors associated with a selected memory cell
302
is connected to ground while the other associated conductor is provided with a read voltage, V
A
′, which has a magnitude similar to the reference voltage, V
A
With this configuration, current flows through the selected memory cell
302
, and the resistance of the cell can then be determined to, thereby, determine the logic value stored by the cell.
As can be appreciated from the above discussion, a large number of transistors are needed to provide memory cell selectivity in known magnetic memory devices. Specifically, two transistors are needed for each column and row conductor of the device. Stated in another way, 2n transistors are needed for every n conductors in a given layer of the magnetic memory device. In that the conductors in known magnetic memory devices are electrically coupled to the memory cells, the voltage provided to the conductors during writing must be kept relatively low to avoid voltage breakdown of the memory cells. For instance, the voltage across any memory cell cannot exceed approximately 1 volt. In order to limit the voltage across the memory cells, the transistors must be relatively large, for example 100 times larger than that would be necessary if the transistor where only used for reading. Accordingly, known magnetic memory devices require a large number of relatively large transistors. Provision of these transistors increases the amount, i.e. area, of semiconductor material (e.g., silicon) required to fabricate the magnetic memory device and, therefore, significantly increases fabrication costs.
From the above, it can be appreciated that it would be desired to have magnetic memory devices that include control circuitry that requires less area to, thereby, reduce the area required by the magnetic memory devices.
SUMMARY OF THE INVENTION
The present disclosure relates to a magnetic memory device. In one embodiment, the magnetic memory device comprises a plurality of memory cells and a plurality of write conductors adjacent the memory cells but electrically isolated from the memory cells, at least two of the write conductors being connected to a single shared switch, wherein the write conductors are configured to provide a path for current to flow to thereby generate magnetic fields used to change a state of the memory cells.
The present disclosure further relates to a method for writing data to a memory cell of a magnetic memory device. In one embodiment, the method comprises providing a write voltage to a first end of a write conductor of the magnetic memory device with a first transistor, the write conductor being electrically isolated from the memory cell, connecting a second end of the write conductor to ground with a second transistor that is connected to at least one other write conductor of the magnetic memory device to create a first current path and a first magnetic field, and providing a write voltage to a separate conductor also connected to ground to create a second current path and a second magnetic field, wherein the first and second field

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