Electronic digital logic circuitry – Signal sensitivity or transmission integrity
Reexamination Certificate
2006-12-12
2010-10-12
Chang, Daniel D (Department: 2819)
Electronic digital logic circuitry
Signal sensitivity or transmission integrity
C326S040000, C326S034000, C327S544000, C365S227000
Reexamination Certificate
active
07812631
ABSTRACT:
In some embodiments, an array of sleep transistors is provided, wherein a combination of said transistors may be enabled during an active mode to reduce leakage depending on the leakage characteristics of a chip or associated chip.
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De Vivek
Kim Nam Sung
Chang Daniel D
Intel Corporation
Nordstrom Erik R.
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