Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2007-11-20
2007-11-20
Siek, Vuthe (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000
Reexamination Certificate
active
10967356
ABSTRACT:
A slack value setting device comprises a worst path selecting section, a first slack value calculating section for calculating slack value set up to each of the transit pins on the worst path, a first slack value setting section for setting up the slack value to each of the transit pins on the worst paths, a worst path branching pin table generating section, a second slack value calculating section for calculating the slack value set up to each of the transit pins on the another paths, a second slack value setting section for setting up the slack value to each of the transit pins on the another paths due to back trace on the another paths from a branching pin stored in the worst path branching pin table; resulting in high speed setting of the slack value on the data paths.
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Fujitsu Limited
Siek Vuthe
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