Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2005-06-28
2005-06-28
Do, Thuan (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000, C716S030000, C716S030000
Reexamination Certificate
active
06912698
ABSTRACT:
Integrated circuits, key components in thousands of products, frequently include thousands and even millions of microscopic transistors and other electrical components. Because of difficulties and costs of fabricating these circuits, circuit designers sometimes ask fabricators to produce skew lots for testing and predicting manufacturing yield. However, conventional skew lots for CMOS circuits, which are based on increasing or decreasing transistor transconductance, are not very useful in testing certain types of analog circuits, such as oscillators. Accordingly, the present inventors developed a new type of skew lot, based on increasing or decreasing gate-to-source capacitance of transistors, or more generally a transistor characteristic other than transconductance. This new type of skew lot is particularly suitable for simulating, testing, and/or making yield predictions for oscillators and other CMOS analog circuits.
REFERENCES:
patent: 6013926 (2000-01-01), Oku et al.
patent: 6229164 (2001-05-01), Momose et al.
patent: 6282135 (2001-08-01), Proebsting
patent: 6515338 (2003-02-01), Inumiya et al.
Brunn Brian T.
Seemann Brian K.
Do Thuan
Drake Eduardo
Hoffman B.
King John
Xilinx , Inc.
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