Site-specific method for large area uniform thickness plan...

Semiconductor device manufacturing: process – Chemical etching – Vapor phase etching

Reexamination Certificate

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C438S689000, C438S700000, C438S691000, C438S745000, C438S046000, C438S047000, C438S734000

Reexamination Certificate

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06927174

ABSTRACT:
A method for preparing a sample includes separating a portion of substrate from a sample, performing focused ion beam milling, and removing additional sample material using an etchant.

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