Semiconductor device manufacturing: process – Introduction of conductivity modifying dopant into... – Diffusing a dopant
Reexamination Certificate
2006-05-02
2006-05-02
Ghyka, Alexander (Department: 2812)
Semiconductor device manufacturing: process
Introduction of conductivity modifying dopant into...
Diffusing a dopant
C438S134000, C438S139000, C438S140000
Reexamination Certificate
active
07037814
ABSTRACT:
In an integrated circuit, dopant concentration levels are adjusted by making use of a perforated mask. Doping levels for different regions across an integrated circuit can be differently defined by making use of varying size and spacings to the perforations in the mask. The diffusion of dopant is completed by making use of an annealing stage.
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Jaeger, Richard C. Introduction to Microelectronic Fabrication, vol. V, Addison-Wesley, 1993. pp. 51-57 and 99-103.
Hopper Peter J.
Lindorfer Philipp
Strachan Andy
Vashchenko Vladislav
Ghyka Alexander
National Semiconductor Corporation
Vollrath Jurgen
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