Single-crystal – oriented-crystal – and epitaxy growth processes; – Apparatus – With means for measuring – testing – or sensing
Patent
1997-02-06
1998-09-01
Garrett, Felisa
Single-crystal, oriented-crystal, and epitaxy growth processes;
Apparatus
With means for measuring, testing, or sensing
117202, C30B 3500
Patent
active
058006125
ABSTRACT:
A single-crystal semiconductor pulling apparatus improves the crystallization rate by reinforcing the physical strength of the Dash's neck portion, and eliminate the process time difference depending on the experiences of operators. The single-crystal semiconductor pulling apparatus, which is according to the Czochralski method, includes controller for automatically controlling the pulling rate of a seed crystal and a melt temperature. The controller modifies a target value of a diameter of a crystal grown from the seed which is immersed from a first value to a second value. The first value is for ensuring dislocation-free state, while the second value is for retaining physical strength of the crystal. Furthermore, the controller is provided with the function of judging the crystal to be in dislocation-free state. That is, the controller measures a length of each portion of the crystal whose diameter is smaller than the first value, and accumulates the length, and judges the crystal to be in dislocation-free state when the accumulate value is a value determined according to a reference length.
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Hiraishi Yoshinobu
Miyamoto Taizou
Shimomura Koichi
Garrett Felisa
Komatsu Electronic Metals Co. Ltd.
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