Simultaneous switch test mode

Details Simultaneous switch test mode Simultaneous switch test mode

2008-04-15

2008-04-15

Britt, Cynthia (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Memory testing

C714S724000, C365S201000

Reexamination Certificate

active

10747276

ABSTRACT:
The present invention provides a simultaneous switching (SS) test mode. SS test modules supporting an SS test mode are provided. When SS test mode is enabled, SS test mode data is driven on a data bus during an idle bus period. Otherwise, when SS test mode is disabled, no SS test mode data is driven on a data bus during an idle bus period.

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“Advanced Electronic Packaging—with Emphasis on Multichip Modules,” William D. Brown, ed., IEEE Press, New York, New York, 1999, pp. vii-xxii and 174-175.
“Focused Ion Beam,” Accurel—Systems International Corp., downloaded on or about Dec. 16, 2003, from link http://www.accurel.com/html/Brochures/PDF/fib—brochure—2.pdf, 2 pages.

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