Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2011-01-04
2011-01-04
Doan, Nghia M (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000, C716S030000, C703S013000, C703S014000, C710S005000, C710S006000, C710S007000, C710S020000, C710S021000, C710S058000, C710S059000, C710S060000, C710S061000, C710S260000, C710S261000, C710S262000, C710S263000, C714S724000, C714S728000, C714S738000, C714S739000, C714S740000, C714S741000
Reexamination Certificate
active
07865854
ABSTRACT:
A method for allowing simultaneous parameter-driven and deterministic simulation during verification of a hardware design, comprising: enabling a plurality of random parameter-driven commands from a random command generator to execute in a simulation environment during verification of the hardware design through a command managing device; and enabling a plurality of deterministic commands from a manually-driven testcase port to execute in the simulation environment simultaneously with the plurality of random parameter-driven commands during verification of the hardware design through the command managing device, the plurality of deterministic commands and the plurality of random parameter-driven commands each verify the functionality of the hardware design.
REFERENCES:
patent: 7316006 (2008-01-01), Cook et al.
patent: 2004/0249618 (2004-12-01), Fine et al.
patent: 2005/0086565 (2005-04-01), Thompson et al.
IBM, Method for Combining and Controlling Manual and Random Stimulus, Sep. 30, 2004.
Averill Duane A.
Phan Christopher T.
Swenson Corey V.
Vincent Sharon D.
Cantor & Colburn LLP
Doan Nghia M
International Business Machines - Corporation
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