Coded data generation or conversion – Digital code to digital code converters – To or from multi-level codes
Reexamination Certificate
2006-09-05
2006-09-05
Wamsley, Patrick (Department: 2819)
Coded data generation or conversion
Digital code to digital code converters
To or from multi-level codes
C327S074000, C327S563000
Reexamination Certificate
active
07102545
ABSTRACT:
Disclosed is a data detector for detecting data placed on a bi-directional data channel having two nodes. The data on the data channel is a combination of data placed on the data channel at both nodes. The data detector at the first node compares data received from the data channel to multiple reference voltages. Which reference voltages are used for comparison is determined by the state of data placed on the data channel at the first node. By comparing the data from the data channel to more than one reference voltage data can be detected with a swing margin of about 50%, such that it is less affected by noise, power or other glitches than are conventional circuits. Methods of detecting data are also disclosed.
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Jackson, Scott A. and Blalock, Benjamin J., “A CMOS Mixed Signal Simultaneous Bidirectional Signal I/O” Circuits and Systems, Aug. 9, 1998, pp. 37-40, XP010327696, IEEE Comput., Soc., USA, ISBN: 0-8186-8914-5.
Marger & Johnson & McCollom, P.C.
Samsung Electronics Co,. Ltd.
Wamsley Patrick
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