Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2005-09-27
2005-09-27
Whitmore, Stacy A. (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000
Reexamination Certificate
active
06951000
ABSTRACT:
A method of generating a simulated voltage contrast image includes steps for receiving as input design information for an integrated circuit die, selecting a net of the integrated circuit from the design information, generating a trace outline of the selected net from the image, analyzing the design information to calculate an interaction between a charged particle beam and the selected net, selecting a shading representative of the calculated interaction, and filling the trace outline of the selected net with the shading to generate the simulated voltage contrast image.
REFERENCES:
patent: 5581742 (1996-12-01), Lin et al.
patent: 6487701 (2002-11-01), Dean et al.
Cowan Joseph
Myers Tracy
Dinh Paul
Fitch Even Tabin & Flannery
LSI Logic Corporation
Whitmore Stacy A.
LandOfFree
Simulated voltage contrasted image generator and comparator does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Simulated voltage contrasted image generator and comparator, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Simulated voltage contrasted image generator and comparator will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3442131