Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2005-09-20
2005-09-20
Smith, Matthew (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000
Reexamination Certificate
active
06948146
ABSTRACT:
The invention provides a design and an integrated circuit having a substantially uniform density and electrical characteristics between parts of the IC that are angled at 45 degrees relative to one another. In particular, the invention provides fill tiling patterns oriented substantially uniformly to electrical structures of either orthogonal or 45 degree angle orientation.
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Allen Robert J.
Cohn John M.
Habitz Peter A.
Leipold William C.
Wemple Ivan L.
Kotulek Richard M.
Levin Naum
Smith Matthew
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