Simplified hole interconnect process

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

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438666, 438700, 438948, 438640, 438673, H01L 21469

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active

058693955

ABSTRACT:
The subject invention is directed to a method for producing semiconductor wafers using a simplified hole interconnect process. These wafers include at least one interconnect layer located on a contact or via layer. As contrasted with the semiconductor wafers produced according to the prior art method described above, the contact or via layer of this invention includes a plurality of patterned openings formed therein which are in substantial alignment without offset with each other.

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patent: 5380621 (1995-01-01), Dichiara et al.
patent: 5691238 (1997-11-01), Avanzino et al.
Carter C. Kaanta, et al. "Dual Damascene:A ULSI Wiring Technology"Jun. 11-12, 1991 VMIC Conference, Proc. of the 8th International VMIC Conf. IEEE, Calif.

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