Simple BICMOS process for creation of low trigger voltage SCR an

Active solid-state devices (e.g. – transistors – solid-state diode – Regenerative type switching device

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297108, 297109, H01L 2974, H01L 31111

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active

058215727

ABSTRACT:
The present invention provides a semiconductor protection device in a substrate having a first type of conductivity. The semiconductor protection device includes two vertical bipolar transistors. A well region is located within the substrate having a second type of conductivity with a base region within the well region having a first type of conductivity. A first doped region having the second type of conductivity and a second doped region having a first type of conductivity are located within the well region. A third doped region having the second type of conductivity and a fourth doped region having the first type of conductivity are located within the base region. A doped region having a first type of conductivity is located within the substrate. This doped region is connected to the fourth doped region.

REFERENCES:
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patent: 5274262 (1993-12-01), Avery
patent: 5453384 (1995-09-01), Chatterjee
patent: 5465189 (1995-11-01), Polgreen et al.
patent: 5473169 (1995-12-01), Ker et al.
patent: 5485024 (1996-01-01), Reoy
patent: 5493133 (1996-02-01), Duvvury et al.
patent: 5500546 (1996-03-01), Marum et al.
patent: 5506742 (1996-04-01), Marum
Bipolar SCR ESD Protection Circuit for High Speed Submicron Bipolar/BiCMOS Circuits; 1995 IEEE; Julian Chen et al.; pp. 14,1.1-14,1.4.

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